File:Kelvin probe force microscopy DE.svg
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English: In Kelvin probe force microscopy, a conducting cantilever is scanned over a surface at a constant height while an AC+DC potential is applied. The AC signal is a sinusoid whose frequency matches the mechanical resonance of the cantilever. The cantilever is driven into oscillation by electrostatic forces where the DC potential difference between the surface and the cantilever is non-zero. Using a four-quadrant detector and an A/D to detect cantilever motion, the feedback circuit drives the DC signal to the surface potential, minimizing cantilever motion and resulting in a map of the work function of the surface.
Deutsch: Beim Raster-Kelvin-Mikroskop wird ein leitfähiger Cantilever (Hebelarm/Ausleger) über in konstanter Höhe über eine Oberfläche bewegt. Gleichzeitig wird ein Summenpotenzial aus eine Gleich- (DC) und eine Wechselspannung (AC) angelegt. Bei der Wechselspannung handelte es sich um eine Sinusförmiges Signal, deren Frequenz der nahe der mechanischen Resonanzfrequenz des Cantilevers entspricht. Der Cantilever wird durch elektrostatische Kräfte zum Schwingen angeregt, wo die Gleichspannung zwischen der Oberfläche und dem Cantilever ungleich Null ist. Mit einem Vier-Quadranten-Detektor und einem Analog-Digital-Wandler (A/D) wird die Bewegung des Cantilver bestimmt und das DC-Signal über einen Regelkreis an das Oberflächenpotenzial angepasst. Auf diese Weise soll die Cantileverbewegung minimiert und die Bestimmung der Verteilung der Austrittsarbeit über die Oberfläche ermöglicht werden. |
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This is a retouched picture, which means that it has been digitally altered from its original version. Modifications: translated. The original can be viewed here: Kelvin probe force microscopy.svg:  . Modifications made by Cepheiden.
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This image is a derivative work of the following images:
- File:Kelvin_probe_force_microscopy.svg licensed with Cc-by-sa-3.0,2.5,2.0,1.0, GFDL
- 2008-03-01T16:53:59Z Inkwina 860x470 (84859 Bytes) Fixed SVG
- 2008-03-01T16:21:40Z Inkwina 860x470 (85506 Bytes) {{Information |Description=In [[w:Kelvin probe force microscopy|Kelvin probe force microscopy]], a conducting [[w:Cantilever#In_MEMS|cantilever]] is scanned over a surface at a constant height while an AC+DC potential is appl
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
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| current | 08:04, 9 February 2011 | | 860 × 470 (62 KB) | Cepheiden (talk | contribs) | {{Information |Description= {{en|In Kelvin probe force microscopy, a conducting cantilever is scanned over a surface at a constant height while an AC+DC potential is applied. The AC signal is |
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