File:Fib tem sample.jpg
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Summary[edit]
DescriptionFib tem sample.jpg |
English: SEM micrograph of a wide-bandgap semiconductor prepared for TEM by focused-ion-beam milling. Deutsch: SEM-Bild eines Halbleiters der fuer Aufnahmen im TEM mit einer FIB praepariert wurde. |
Date | |
Source | English wikipedia |
Author | english User:Cm the p |
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This file is licensed under the Creative Commons Attribution-Share Alike 3.0 Unported license. Subject to disclaimers. | ||
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This licensing tag was added to this file as part of the GFDL licensing update.http://creativecommons.org/licenses/by-sa/3.0/CC BY-SA 3.0Creative Commons Attribution-Share Alike 3.0truetrue |
Permission is granted to copy, distribute and/or modify this document under the terms of the GNU Free Documentation License, Version 1.2 or any later version published by the Free Software Foundation; with no Invariant Sections, no Front-Cover Texts, and no Back-Cover Texts. A copy of the license is included in the section entitled GNU Free Documentation License. Subject to disclaimers.http://www.gnu.org/copyleft/fdl.htmlGFDLGNU Free Documentation Licensetruetrue |
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Date/Time | Thumbnail | Dimensions | User | Comment | |
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current | 14:36, 3 February 2007 | 1,024 × 800 (205 KB) | EdC (talk | contribs) | {{Information |Description=SEM micrograph of a wide-bandgap semiconductor prepared for TEM by focused-ion-beam milling. |Source=English wikipedia |Date=9 March 2006 |Author=english User:Cm the p |Permission= |other_versions= }} [[category:Focused Ion Bea |
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Orientation | Normal |
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Horizontal resolution | 100 dpi |
Vertical resolution | 100 dpi |
Software used | Adobe Photoshop CS Windows |
File change date and time | 07:08, 9 March 2006 |
Color space | Uncalibrated |