File:NIST Nanoscale Dimensioning Technique Wins R&D 100 Award (5941057710).jpg

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Ravikiran Attota, a lead researcher in NIST's Precision Engineering Division, won an R&D 100 Award for his development of the Through-Focus Scanning Optical Microscopy (TSOM), which has applications that cut across a range of industries, from biotechnology to semiconductors and photonics.

Courtesy National Institute of Standards and Technology

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Source NIST Nanoscale Dimensioning Technique Wins R&D 100 Award
Author National Institute of Standards and Technology

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This image is in the public domain in the United States because it is a work of the United States Federal Government, specifically an employee of the National Institute of Standards and Technology, under the terms of Title 17, Chapter 1, Section 105 of the US Code.

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This image was originally posted to Flickr by National Institute of Standards and Technology at https://flickr.com/photos/63059536@N06/5941057710. It was reviewed on 7 September 2016 by FlickreviewR and was confirmed to be licensed under the terms of the United States Government Work.

7 September 2016

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current02:10, 7 September 2016Thumbnail for version as of 02:10, 7 September 20161,800 × 1,257 (1.51 MB)Vanished Account Byeznhpyxeuztibuo (talk | contribs)Transferred from Flickr via Flickr2Commons

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