File:Pankey-2.tif
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English: The thin films produced undergo thorough examination by the most exacting analytical tools of science so that more may be learned about thin films and their potential uses. Measurements of the film are made with an x-ray spectrogoniometer into which Dr. Titus Pankey is inserting the sample to determine and control the characteristics of solid state devices within vacuum system. |
Date | |
Source |
U.S. Naval Research Laboratory - from the No. 6 Issue of NRL Labstracts dated: Feb. 7, 1964 https://www.nrl.navy.mil/News-Media/Images/ |
Author | U.S. Naval Research Laboratory |
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[edit]Public domainPublic domainfalsefalse |
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current | 18:24, 22 February 2023 | ![]() | 1,299 × 1,269 (1.6 MB) | CamrynBell (talk | contribs) | Uploaded a work by U.S. Naval Research Laboratory from U.S. Naval Research Laboratory - from the No. 6 Issue of NRL Labstracts dated: Feb. 7, 1964 https://www.nrl.navy.mil/News-Media/Images/ with UploadWizard |
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Image title | Electronic Goodies-The thin films produced undergo thorough examination by the most exacting analytical tools of science so that more may be learned about thin films and their potential uses. Mr. Ronald H. Deiter (left) studies the electron diffraction pattern of a germanium thin film. Further measurements of the film are made with an x-ray spectrogoniometer into which Dr. Titus Pankey (center) is inserting the sample.To determine and control the charateristics of solid state devices within vacuum system, Mr. Charles Holland (right) uses an electron beam system for viewing the characteristics on a cathode-ray oscillograph. This photo is in the No. 6 Issue of NRL Labstracts dated:Feb. 7, 1964 |
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Width | 1,299 px |
Height | 1,269 px |
Bits per component | 8 |
Compression scheme | Uncompressed |
Pixel composition | Black and white (Black is 0) |
Image data location | 29,804 |
Orientation | Normal |
Number of components | 1 |
Number of rows per strip | 1,269 |
Bytes per compressed strip | 1,648,431 |
Horizontal resolution | 300 dpi |
Vertical resolution | 300 dpi |
Software used | Adobe Photoshop CS5 Macintosh |
File change date and time | 16:06, 9 June 2014 |
Exif version | 2.21 |
Color space | Uncalibrated |