File:Sandia-surface-junction-ion-trap NJP13.075018.jpg
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[edit]DescriptionSandia-surface-junction-ion-trap NJP13.075018.jpg |
English: Scanning electron microscope (SEM) image of a YH-junction trap. In each trap, 47 independent dc electrodes are routed for wire bonding to the ceramic pin grid array (CPGA). The rf electrodes are ≈42.5 μm wide with a nominal center-to-center spacing of ≈142.9 μm. All gaps between electrodes are 7 μm. Inset: image of seven ions trapped above the loading hole. The average ion–ion spacing in this image is ≈3.5 μm. |
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Design, fabrication and experimental demonstration of junction surface ion traps, New J. Phys. 13 075018 (2011). DOI: https://doi.org/10.1088/1367-2630/13/7/075018 Figure 1 |
Author | D L Moehring, C Highstrete, D Stick, K M Fortier, R Haltli, C Tigges and M G Blain |
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