File:Semiconductor fabrication with and without CMP RU.svg

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English: Comparison between semiconductor circuits manufactured with and without chemical-mechanical polishing (cross section
Русский: Сравнение срезов ru:СБИС, изготовленных без использования CMP (Химико-механической планаризации) - слева, и с использованием CMP после каждого слоя - справа.
Deutsch: Vergleich zwischen Halbleiterschaltkreisen hergestellt mit und ohne chemisch-mechanisches Polieren (Querschnitt)
Español: Comparación de Semiconductores fabricados sin y con Pulimiento Químico-Mecánico
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Source translate of File:Semiconductor_fabrication_with_and_without_CMP_DE.svg
Author A5b
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File:Semiconductor_fabrication_with_and_without_CMP_DE.svg,

File:Fabricación de Semiconductores con y sin PQM (CMP).svg

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Date/TimeThumbnailDimensionsUserComment
current03:29, 20 November 2010Thumbnail for version as of 03:29, 20 November 20101,024 × 568 (31 KB)A5b (talk | contribs){{Information |Description={{en|1=Comparison between semiconductor circuits manufactured with and without chemical-mechanical polishing (cross section}} {{ru|1=Сравнение срезов ru:СБИС, изготовленных без испол�
03:27, 20 November 2010Thumbnail for version as of 03:27, 20 November 20101,024 × 568 (31 KB)A5b (talk | contribs){{Information |Description={{en|1=Comparison between semiconductor circuits manufactured with and without chemical-mechanical polishing (cross section}} {{ru|1=Сравнение срезов ru:СБИС, изготовленных без испол�
03:19, 20 November 2010Thumbnail for version as of 03:19, 20 November 20101,024 × 568 (32 KB)A5b (talk | contribs){{Information |Description={{en|1=Comparison between semiconductor circuits manufactured with and without chemical-mechanical polishing (cross section}} {{ru|1=Сравнение срезов ru:СБИС, изготовленных без испол�

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